Our newly released, ultra-precision surface profiler, XYRIS 20/20 range uses a state-of-the-art vision and confocal measurement systems. It provides the ability to measure large scale features (100’s mm) with nanometric precision. The system is automated to measure, analyse, and report in seconds providing enhanced precision and reduced work time.
Available configured for INDUSTRIAL, LABORATORY or OFFICE operation as well as ROTARY DISK AND ROTARY CYLINDER measurement options.
Offering motion system ranges of upto 300mm x 300mm with 100nm positional resolution and incorporating any of our sensor options.
A compact system providing a 25mm x 25mm measurement area with 10nm positional resolution.
Bespoke systems and software solutions tailored to your research and production metrology needs.
A solid state high-speed arc imaging system for measuring transient arc motion in circuit switching devices.