XYRIS 20/20
Our newly released, ultra-precision surface profiler, XYRIS 20/20 range uses a state-of-the-art vision and confocal measurement systems. It provides the ability to measure large scale features (100’s mm) with nanometric precision. The system is automated to measure, analyse, and report in seconds providing enhanced precision and reduced work time.
Available configured for INDUSTRIAL, LABORATORY or OFFICE operation as well as ROTARY DISK AND ROTARY CYLINDER measurement options.