Our newly released, ultra-precision surface profiler, XYRIS 20/20 (Rotary) uses a confocal white-light sensor with a state-of-the-art vision system. It provides the ability to measure the thickness and wear of polymer coatings (the coloured strips in the images above) with nanometric precision. The system is automated to measure, analyse, and report in seconds providing enhanced precision and reduced work time. For a more detailed description of the application, see here
Offering motion system ranges of upto 300mm x 300mm with 100nm positional resolution and incorporating any of our sensor options.
A compact system providing a 25mm x 25mm measurement area with 10nm positional resolution.
Bespoke systems and software solutions tailored to your research and production metrology needs.
A solid state high-speed arc imaging system for measuring transient arc motion in circuit switching devices.