XYRIS 20/20

Our newly released, ultra-precision surface profiler, XYRIS 20/20 (Rotary) uses a confocal white-light sensor with a state-of-the-art vision system.  It provides the ability to measure the thickness and wear of polymer coatings (the coloured strips in the images above) with nanometric precision. The system is automated to measure, analyse, and report in seconds providing enhanced precision and reduced work time. For a more detailed description of the application, see here

XYRIS 2000

Offering motion system ranges of upto 300mm x 300mm with 100nm positional resolution and incorporating any of our sensor options.

XYRIS 2000

XYRIS 4000

A compact system providing a 25mm x 25mm measurement area with 10nm positional resolution.

XYRIS 4000

XYRIS CUSTOM

Bespoke systems and software solutions tailored to your research and production metrology needs.

XYRIS CUSTOM

ARC IMAGER

A solid state high-speed arc imaging system for measuring transient arc motion in circuit switching devices.

ARC IMAGER