Offering motion system ranges of upto 300mm x 300mm with 100nm positional resolution and incorporating any of our sensor options.
A compact system providing a 25mm x 25mm measurement area with 10nm positional resolution.
Bespoke systems for your precise needs.
A solid state high-speed arc imaging system for measuring transient arc motion in circuit switching devices.
XYRIS SYSTEMS SERIES
Our XYRIS series of three dimensional (3D) measurement systems features ease of use, high precision, and measurement speed and flexibility thanks to the modular nature of the systems.
Because data generated by the systems is available as a 3D surface map standard tasks such as extraction of surface information (feature measurement, profiling cross sections, roughness and form analysis, volume calculation, wear analysis, etc) are easy to perform and built into our stand alone analysis package BODDIES. Data can also be exported as 3D files, raw data (including Excel format) or images enabling the creation of professional reports in minutes.
Automated measurement functions are part of the standard control software and enable you to perform repeat or automated measurements at the touch of a button. Fully customised and automated systems can be developed for your precise needs saving you time and money.
XYris systems combine the benefits of an instrument for the measurement of the intricate detail of surface form and texture, while retaining capability for large scale, high precision coordinate measurement in a single convenient package.
An important feature of the XYris systems is the measurement region is defined by the user, not the system optics. The XYris series provide the same high resolution of surface height over the entire measurement region, if this is a few micrometres or hundreds of millimetres.
XYris systems use confocal sensors which have their own internal light source (Laser or White light), and are able to measure all types of materials and surfaces; polymers, metals, ceramics, films, diffuse (rough), specular (reflective), and transparent.
TaiCaan Research have developed a solid state high speed arc imaging system.
Measuring arc motion in circuit switching devices is crucial to understanding their behaviour and refining their design.
Arcing events are brief (often entirely completed in <10ms) and explosive with an extremely high dynamic range of event intensity. The transient arc motion during these events can be measured in terms of micro or even nanoseconds. These characteristics make conventional photography and ultra-high speed video impractical.
In nature the solution to track rapid motion is the compound eye where an array of micro lenses operate together.
- Maximum spatial and displacement resolution achieved over entire measurement area – unlike field techniques wherethe highest resolution is only achieved with the smallest measurement field.
- Nanoscale surface analysis and macroscale form measurement in one instrument.
- True 3D measurement – the measurement is a point cloud of true surface measurement points rather than anapproximate interpretation of a surface image.