I.C.E SYSTEM Accelerated life testing for MEMS switch contacts In-Situ Contact Evolution (I.C.E) for MEMS ISO/ MIL Standard Compliant Contact Testing High Speed Contact Switching (350 Million Operations/Day) Ultra Precision Laser 3D Surface Mapping Live Feedback from Colour Video Microscopy Testing MEMS (Micro Electro Mechanical) switch contacts is a challenging problem as the MEMS switch …
